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CE Certified Thermal Shock Testing Machine Three Phase For Semiconductor Test

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CE Certified Thermal Shock Testing Machine Three Phase For Semiconductor Test

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Brand Name :	Neide
Model Number :	ND-150
Certification :	CE
Price :	Negotiable
Payment Terms :	L/C,D/A,D/P,T/T,Western Union,MoneyGram
Supply Ability :	100sets/month
Delivery Time :	7-22 work days

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Product Details
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CE Certified Thermal Shock Testing Machine Three Phase For Semiconductor Test

CE Certified Thermal Shock Chamber For Semiconductor Testing

Production Description:

The Thermal Shock Test Chamber represents a state - of - the - art testing instrument engineered to assess the robustness of material structures and composite materials subjected to rapid and consecutive transitions between elevated - temperature and cryogenic - temperature environments. This chamber facilitates the evaluation of materials within the most expedient time frame, ascertaining the magnitude of thermal expansion and contraction, along with any concomitant chemical alterations or physical impairments.

Specification:

Model	ND-42 (A~C)	ND-60 (A~C)	ND-80 (A~C)	ND-100 (A~C)	ND-120 (A~C)	ND-150 (A~C)
Inner size: WHD(cm)	403035	503040	504040	505040	604050	605050
External size: WHD(cm)	150180150	160175160	160185160	160185170	170185170	170195170
Temperature range(Test Chamber)	high temperature:+60℃~+200℃;low temperature -10℃~-65℃(A:-45℃;B:-55℃;C:-65℃)
Heating Time	RT~200℃ About 30min
Cooling Time	RT~-70℃ About 85min
Temperature Conversion Time

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